eXpanded Intelligence
Artificial Intelligence
A deep learning framework based on neural networks (CNNs & GANs) and other intelligent algorithms.
Smart Pattern Recognition
Profit from automatic pattern recognition and classification.
Intelligent Tool Analytics
Analyze tool combinations and pinpoint process improvement possibilities.
Multidimensional View
Improve your operation through multivariate data monitoring.
Deep Root Cause Analytics
Smart root cause analysis enables immediate implementation of corrective measures.
Smart Decision Making
Data driven decision-making leads to substantial productivity gains.
Intelligent Tool Analytics
Optimize your equipment uptime and prevent failures
YWDXI allows you to analyze tool interactions with maximum efficiency. Detect tools that contribute to yield loss, or identify "golden tool combinations" for routing critical lots.
Smart Pattern Recognition
Optimize your semiconductor manufacturing process
YWDXI automatically detects and classifies wafers with conspicuous patterns - enabling rapid material review and wafer disposition. Machine learning supports both rule-based and data-driven detection.
Deep Root-Cause Analysis
Multivariate Monitoring for full process visibility
YWDXI's multivariate monitoring helps you review individual parameters and detect issues that otherwise wouldn't be visible. Fast processing and calculation times are ensured by mechanisms like dimension reduction. Built-in Principal Component Analysis lets you take corrective actionimmediately.
Watch our Webinar on AI in Yield Analytics
Learn how to quickly and easily identify problems in semiconductor manufacturing processes:
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Leading semiconductor companies around the globe trust DR YIELD to improve their product stability, reliability and yield.
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We have definitely detected more problematic wafers that would have gone undetected without YieldWatchDog.
