eXpanded Intelligence
Artificial Intelligence
A deep learning framework based on neural networks (CNNs & GANs) and other intelligent algorithms.
Smart Pattern Recognition
Profit from automatic pattern recognition and classification.
Intelligent Tool Analytics
Analyze tool combinations and pinpoint process improvement possibilities.
Multidimensional View
Improve your operation through multivariate data monitoring.
Deep Root Cause Analytics
Smart root cause analysis enables immediate implementation of corrective measures.
Smart Decision Making
Data driven decision-making leads to substantial productivity gains.
Intelligent Tool Analytics
Optimize your equipment uptime and prevent failures
YWDXI allows you to analyze tool interactions with maximum efficiency. Detect tools that, in combination, contribute to yield loss, or identify "golden tool combinations" for routing of important lots.
Smart Pattern Recognition
Optimize your semiconductor manufacturing process
YWDXI automatically detects and classifies wafers with conspicuous patterns - this enables rapid material review and wafer disposition. Machine learning algorithms allow trained and untrained pattern detection.
Deep Root-Cause Analysis
Multivariate Monitoring for full process visibility
The multivariate monitoring feature of YWDXI allows you to review individual parameters and detect issues that would otherwise not be visible. Fast processing and calculation times are ensured by deploying mechanisms such as dimension reduction. Built-in Principal Component Analysis enables you to set corrective measurements immediately.
Watch our Webinar on AI in Yield Analytics
and learn how to quickly and easily identify problems in the semiconductor manufacturing processes:
Trusted by
DR YIELD is the trusted supplier of data analysis solutions for leading semiconductor manufacturers around the globe.
“
We have definitely detected more problematic wafers that would have gone undetected without YieldWatchDog.
