YieldWatchDog

The Advanced Semiconductor Yield Analytics Platform

See What Other Platforms Can't Show You

End-to-end data analytics and correlation tools enable deep insight into your manufacturing and test data.

Know Before It Becomes a Problem

Identify irregularities instantly, trigger alerts or tasks automatically, and generate reports based on user-defined templates.

Trace Every Material, Reveal Any Blind Spots.

Trace the movement of semiconductor materials along the entire supply chain.

Catch Equipment Drift Before It Kills Your Yield

Effectively analyze the performance of your manufacturing and test tools.

Complete Context — Every Event, Every Change, Every Tool

Monitor equipment, supply changes, and maintenance events in one place.

One Platform. Any Data Format. No Manual Conversion.

Automatically convert and integrate data from multiple sources into one centralized database.

Viewing Wafer Maps with Smart YieldWatchDog Software

Analyzing Semiconductor Data with Deep Learning Framework eXpanded Intelligence of YieldWatchDog

Reviewing waterfall charts with YieldWatchDog's enhanced visualization tools

Enhanced Data Visualization

Most analytics platforms show you data. YieldWatchDog shows you what it means — specifically for semiconductor manufacturing. Every visualization, calculation, and interactive view is designed around how semiconductor engineers think and what they need to see. The result: faster root-cause identification, fewer missed defects, and yield insights that generic tools simply can't match.

Pinpoint factory events and their yield impact in minutes, not days
Detect equipment drift and process deviation before it reaches test
Diagnose complex yield loss patterns with tools built for semiconductor complexity
Trace materials across the full supply chain with complete traceability
Compress product ramp-up timelines with faster data-driven decision cycles

Smart Defect Insight Starts Here

Defect Module

Defect data only tells half the story. The Defect Module brings inspection results, yield metrics, and tool performance into one correlated view — so you can stop chasing symptoms and start finding causes. No switching tools. No data export. No lost context.

DEFECT MODULE

Artificial Intelligence

YieldWatchDog^XI

Most yield platforms added AI as an afterthought. YieldWatchDog-XI was built on a deep learning framework designed for the complexity of semiconductor data –high dimensionality, sparse defect signals, and multi-source correlation. The result: anomaly detection and predictive insights beyond what generic ML tools can deliver. Engineers using XI don't just react faster — they catch issues that would otherwise go unseen.

YWD-XI

Advanced Quality Module

PAT

Built for automotive and other quality-critical industries. Identify potentially quality-compromised parts based on Part Average Testing (PAT) and advanced rules.

AQM/PAT