YieldWatchDog - XI
The Artificial Intelligence layer to get the most out of your semiconductor data.
Intelligent Tool Analytics
Optimize your equipment uptime and prevent failures
YWDXI allows you to analyze tool interactions with maximum efficiency! Detect tools that in combination contribute to yield loss, or contrarily identify "golden tool combinations" for routing of important lots.
Smart Pattern Recognition
Optimize your semiconductor manufacturing process
YWDXI automatically detects and classifies wafers with inconspicuous patterns - this enables rapid material review and wafer disposition. Machine learning algorithms allow trained and untrained pattern detection!
Deep Root-Cause Analysis
Multivariate Monitoring for full process visibility
The multivariate monitoring feature of YWDXI allows you to review individual parameters and detect issues that would otherwise not be visible. Fast processing and calculation times are ensured by deploying mechanisms such as dimension reduction. Built-in Principal Component Analysis enables you to set corrective measurements immediately.
Most definitely, we have detected more problematic wafers that would have gone undetected.