The AI layer to get the most out of your semiconductor data
Intelligent Tool Analytics
Optimize your equipment uptime and prevent failures
YWDXI allows you to analyze tool interactions with maximum efficiency. Detect tools that, in combination, contribute to yield loss, or identify "golden tool combinations" for routing of important lots.
Smart Pattern Recognition
Optimize your semiconductor manufacturing process
YWDXI automatically detects and classifies wafers with conspicuous patterns - this enables rapid material review and wafer disposition. Machine learning algorithms allow trained and untrained pattern detection.
Deep Root-Cause Analysis
Multivariate Monitoring for full process visibility
The multivariate monitoring feature of YWDXI allows you to review individual parameters and detect issues that would otherwise not be visible. Fast processing and calculation times are ensured by deploying mechanisms such as dimension reduction. Built-in Principal Component Analysis enables you to set corrective measurements immediately.
Watch our Webinar on AI in Yield Analytics
and learn how to quickly and easily identify problems in the semiconductor manufacturing processes:
We have definitely detected more problematic wafers that would have gone undetected without YieldWatchDog.