YieldWatchDog

The smart semiconductor data visualization and automated process control solution

Enhanced Data Visualization

End-to-end data analytics and correlation tools enable deep insight into your manufacturing and test data.

Automatic Notifications & Reports

Find out as soon as any irregularity occurs and trigger various actions if needed. Generate reports based on user-defined templates.

Full Supply Chain Visibility

Trace the movement of semiconductor materials along the entire supply chain.

Equipment Monitoring

Analyze the performance of your manufacturing and test tools more effectively.

Event Control

Monitor equipment supply changes, maintenance events or similar.

Standardized Data Integration

Automatically converts and integrates all your data in different formats and from various sources into one centralized database.

Viewing Wafer Maps with Smart YieldWatchDog Software

Analyzing Semiconductor Data with Deep Learning Framework eXpanded Intelligence of YieldWatchDog

Reviewing waterfall charts with YieldWatchDog's enhanced visualization tools

Smart Defect Insight Starts Here

Defect Module

Analyze defect inspection data in context — right next to your production and test metrics. The Defect Module lets you correlate inspection results with yield loss, tool performance and more, all within one seamless platform.

DEFECT

Artificial Intelligence

YieldWatchDog^XI

eXpanded Intelligence for smart manufacturing and deep learning. Machine Learning and other intelligent algorithms enable fast, data-driven decision making.

YWD-XI

Advanced Quality Module

PAT

For companies in automotive and other quality-critical industries. Identify potentially quality-compromised parts based on Part Average Testing (PAT) and other advanced rules.

AQM/PAT