Material Tracing Module
Material Tracing Module for full traceability
Lot, wafer, and die genealogy tracking along the supply chain — trace material history from raw input through final test.
Capabilities
Material Tracing Module: what it does
- Full lot-, wafer- or device-level traceability throughout the entire supply chain
- Genealogy tool: movement tracing along the entire manufacturing process
- Trace from raw input through final test
- Lot-tracing information loads alongside test, defect and equipment data
Related pages
Support
Direct support from our experts
A direct technical contact who understands the software and the industry — no ticketing queue, the same level of support regardless of company size.
See it working on your own data
Low-cost trial installations are available. Our team will write the loaders and parsers for your data during the installation.
Schedule DemoFAQ
Frequently asked questions
What does the Material Tracing Module cover?
The module provides full lot-, wafer- or device-level traceability throughout your entire supply chain. The genealogy tool allows movement tracing along the entire manufacturing process, from raw input through final test, so you can follow where material came from and where it went. It was introduced with YieldWatchDog 3.8 as the Material Tracing feature, adding full traceability and supply chain visibility.
How does traceability data get into YieldWatchDog?
Lot-tracing information is loaded as additional context data alongside the core measurement data, using the same standardized data integration process as every other source: our integration experts write the converters that parse your data into the YieldWatchDog format, or your in-house experts follow our integration guidelines. Because all YieldWatchDog databases use the same data model, tracing information, test data, defect data and equipment history end up in one correlated view.
Why does traceability matter for yield analysis?
Yield problems are rarely visible from one data source in isolation. When material genealogy sits next to test, defect and equipment data, an engineer investigating an excursion can move from “something changed” to “this lot, this tool, this time window” without manually cross-referencing several systems, and can find out which other material was affected. That shortens containment and supports quality-critical industries that must be able to show exactly which parts went through which process.