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Watch our Webinar on AI in Yield Analytics

and learn how to quickly and easily identify problems in the semiconductor manufacturing processes.

During this 10-minute webinar we’re going to show you three examples of how we use AI in yield analytics to help engineers and managers identify issues arising in the semiconductor manufacturing processes.

Multivariate Monitoring for faster problem detection

Tool Combination Analysis to discover good or bad tool combinations

Spatial Wafer Pattern Detection and Classification (ML) for automated pattern detection of wafer maps

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