DR_YIELD
December 9, 2025
Defect Module
Unified Data Environment
Eliminate siloed defect inspection data
The Defect Module brings defect inspection data into YieldWatchDog – alongside yield, test, and process metrics. No more switching tools, no more fragmented analysis.
Visual Clarity with Smart Tools
From defect trends to interactive wafer maps
Explore inspection layers, defect clusters, kill ratios, and more with powerful visualizations. Overlay data, spot adders and repeaters, view related defect images and understand how issues evolve over time, all in just a few clicks.
Fast Root Cause Detection
Go from issue to action
Link defects directly to tools, process steps, or lots. With built-in exports, overlays, and trend tools, engineers can pinpoint root causes and take targeted action, improving yield and preventing recurrence.
Want to see the Defect Module in Action?
Experience seamless defect inspection directly within the YieldWatchDog platform.
See how wafer maps, inspection layers, and defect trends come together in one powerful, unified view.
“
Since we started using YieldWatchDog we have gained an enormous amount of value from our production test data.”
Bernd Fankhauser
Operations Manager at Vishay Semiconductor
Trusted by
Leading semiconductor companies around the globe trust DR YIELD to improve their product stability, reliability and yield.
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