Multivariate analysis, also known as multivariate monitoring, enables the detection of issues that are invisible when viewing individual parameters. … Read More
yield data analytics
Preventing process excursion with AI & yield management software (YMS)
Early detection and analysis of process excursions decreases wafer scraps, prevents yield loss and saves engineering and manufacturing resources. … Read More
What is achievable with a Yield Management System?
Cutting-edge Yield Management Systems integrate Big Data, Smart Data, Machine Learning and AI analytics to enable semiconductor manufacturers to gain deep insight fast and save costs. … Read More
Advanced Quality Module incl. Part Average Testing (PAT)
Automotive and other quality-critical microchip suppliers have specified and rigorous requirements in order to achieve zero defects and enhance quality control and reliability. Part Average Testing (PAT) is one of the fundamental features of the Advanced Quality Module. … Read More
