The greenest chip is the one you don’t have to remake. Learn how yield management drives real sustainability gains in semiconductor manufacturing. … Read More
yield analysis
Bringing It All Together: The Story Behind Our New Defect Module
While we’ve discussed the idea of integrating defect data had been discussed internally for years, the integration was waiting for the right moment. One key reason? Most customers already had established defect management systems in place, and there was little … Read More
Celebrating 20 Years of Innovation: DR YIELD’s Journey from Startup to Global Leader
The 15th of March marked a momentous occasion for DR YIELD: its 20th anniversary! It’s a time for reflection, celebration, and gratitude as DR YIELD looks back on its journey from a startup to a global leader in semiconductor yield … Read More
Leveraging Machine Learning in Semiconductor Yield Analysis
Leveraging ML to easily identify and classify wafer spatial patterns in semiconductor manufacturing. … Read More
Using Predictive Data Analytics in Manufacturing
Predictive analysis capabilities provide deep insights for production optimization and can predict failures based on anomalies in the data. … Read More
Installing yield software early in a ramp up
The accessibility of all data for cross-correlation and deep dives into potential culprits of yield loss is a decisive factor in the success of a yield ramp – whether for a new product, a new process line or a completely new fab. … Read More
Multivariate Analysis for Full Process Visibility
Multivariate analysis, also known as multivariate monitoring, enables the detection of issues that are invisible when viewing individual parameters. … Read More
Preventing process excursion with AI & yield management software (YMS)
Early detection and analysis of process excursions decreases wafer scraps, prevents yield loss and saves engineering and manufacturing resources. … Read More
What is achievable with a Yield Management System?
Cutting-edge Yield Management Systems integrate Big Data, Smart Data, Machine Learning and AI analytics to enable semiconductor manufacturers to gain deep insight fast and save costs. … Read More
Advanced Quality Module incl. Part Average Testing (PAT)
Automotive and other quality-critical microchip suppliers have specified and rigorous requirements in order to achieve zero defects and enhance quality control and reliability. Part Average Testing (PAT) is one of the fundamental features of the Advanced Quality Module. … Read More
