YMS

Multivariate Analysis for Full Process Visibility  

Multivariate analysis, also known as multivariate monitoring, enables the detection of issues that are invisible when viewing individual parameters. … Read More

Preventing process excursion with AI & yield management software (YMS)

Early detection and analysis of process excursions decreases wafer scraps, prevents yield loss and saves engineering and manufacturing resources. … Read More

What is achievable with a Yield Management System?

Cutting-edge Yield Management Systems integrate Big Data, Smart Data, Machine Learning and AI analytics to enable semiconductor manufacturers to gain deep insight fast and save costs. … Read More