Multivariate analysis, also known as multivariate monitoring, enables the detection of issues that are invisible when viewing individual parameters. … Read More
yieldanalytics
Multivariate Analysis for Full Process Visibility
Tags: automotive, chip, predictive data analysis, predictive data analytics, predictive software, semiconductor, semiconductor enhancement, semiconductor yield, yield analysis, yield analysis software, yield data analytics, yield improvement, yield management system, yield software, yieldanalytics, yieldwatchdog, YMS
Preventing process excursion with AI & yield management software (YMS)
Early detection and analysis of process excursions decreases wafer scraps, prevents yield loss and saves engineering and manufacturing resources. … Read More
Tags: automotive, chip, predictive data analysis, predictive data analytics, predictive software, semiconductor, semiconductor enhancement, semiconductor process excursion, semiconductor yield, yield analysis, yield analysis software, yield data analytics, yield improvement, yield management system, yield software, yieldanalytics, yieldwatchdog, YMS