Multivariate analysis, also known as multivariate monitoring, enables the detection of issues that are invisible when viewing individual parameters. … Read More
YMS
Multivariate Analysis for Full Process Visibility
Tags: automotive, chip, predictive data analysis, predictive data analytics, predictive software, semiconductor, semiconductor enhancement, semiconductor yield, yield analysis, yield analysis software, yield data analytics, yield improvement, yield management system, yield software, yieldanalytics, yieldwatchdog, YMS
Preventing process excursion with AI & yield management software (YMS)
Early detection and analysis of process excursions decreases wafer scraps, prevents yield loss and saves engineering and manufacturing resources. … Read More
Tags: automotive, chip, predictive data analysis, predictive data analytics, predictive software, semiconductor, semiconductor enhancement, semiconductor process excursion, semiconductor yield, yield analysis, yield analysis software, yield data analytics, yield improvement, yield management system, yield software, yieldanalytics, yieldwatchdog, YMS
What is achievable with a Yield Management System?
Cutting-edge Yield Management Systems integrate Big Data, Smart Data, Machine Learning and AI analytics to enable semiconductor manufacturers to gain deep insight fast and save costs. … Read More
Tags: automotive, big data, chip, predictive data analysis, predictive data analytics, predictive software, semiconductor, semiconductor enhancement, semiconductor yield, yield analysis, yield analysis software, yield data analytics, yield improvement, yield management system, yield software, yieldwatchdog, YMS