Defect Module

Your defects, decoded. Your yield, optimized.

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Unified Data Environment

Eliminate siloed defect inspection data

The Defect Module brings defect inspection data into the YieldWatchDog environment where yield, test, and process metrics already live. No more switching tools, no more fragmented analysis.

Visual Clarity with Smart Tools

From defect trends to interactive wafer maps

Explore inspection layers, defect clusters, kill ratios, and more with powerful visualizations. Overlay data, spot adders and repeaters, view related defect images and understand how issues evolve over time, all with a few clicks.

Fast Root Cause Detection

Go from issue to action

Link defects directly to tools, process steps, or lots. With built-in exports, overlays, and trend tools, engineers can pinpoint root causes and take targeted action, improving yield and preventing recurrence.

Want to see the Defect Module in Action?

Experience seamless defect inspection directly within the YieldWatchDog platform. See how wafer maps, inspection layers, and defect trends come together in one powerful, unified view.
GET IN CONTACT

“

Since we started using YieldWatchDog we have gained an enormous amount of value from our production test data.”

Bernd Fankhauser
Operations Manager at Vishay Semiconductor
Trusted by

Leading semiconductor companies around the globe trust DR YIELD to improve their product stability, reliability and yield.

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