PAT
Advanced Quality Module / PAT
Part Average Testing and neighborhood rules for automotive and other zero-defect industries.
Learn more →Outsourced assembly and test
OSAT yield management software
Assembly and test for many customers: YieldWatchDog brings wafer sort and final test data into one database, screens parts with Part Average Testing and creates reports for your customers automatically.
What matters
Built for the test floor
Test data from every tester
Wafer sort and final test results are loaded automatically from STDF, ATDF and other formats. Every imported lot is checked against SPC rules, and Spatial Signature Control finds recurring patterns on the wafer maps.
Part Average Testing for automotive customers
The Advanced Quality Module screens parts that pass the test limits but deviate from their peers — with static, dynamic and gap-based PAT, neighborhood rules and value-shift detection, configurable per product, test insertion and customer requirements.
Traceability and customer reports
Material Tracing follows lots, wafers and dies through final test. Event Control shows what changes after a probe card change or maintenance, and the Reporting Server sends reports to your customers per lot or on a schedule.
Why YieldWatchDog
Many customers, one database
An OSAT tests products for many customers, each with its own requirements for limits, screening and reporting. YieldWatchDog keeps all test data in one consistent data model, so screening rules and reports are set up per product and customer, and engineers compare products, lots and test insertions in one place.
Typical edition
The edition that usually fits
YieldWatchDog Industrial
Industrial is the typical edition for OSATs: 16 CPU cores, unlimited concurrent clients and 120 annual support hours, for many users and high customization requirements.
Editions are sized by scale, not by company type. We’ll help you choose.
Compare the editions →Modules
Modules worth a closer look
Every module is independently licensable and can be added to any edition.
SPC
Statistical Process Control
Automatic control limits, Shewhart and new, specially developed monitoring rules, with notifications.
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SSC
Spatial Signature Control
Detect, mark and search recurring spatial wafer patterns, with email alerts when a pattern matches.
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MTM
Material Tracing Module
Trace lot, wafer and die genealogy along the supply chain, from raw input to the final test.
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ECM
Event Control Module
Analyze what changes after maintenance, supply changes or probe card changes — and get notified.
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RSM
Reporting Server Module
Automatic HTML and PDF reports, triggered per lot, on a schedule, by an SPC violation or manually.
Learn more →Support
Direct support from our experts
A direct technical contact who understands the software and the industry — no ticketing queue, the same level of support regardless of company size.
See it working on your own data
Low-cost trial installations are available. Our team will write the loaders and parsers for your data during the installation.
Schedule Demo