DR YIELD — Making Data Smart

Foundries

Semiconductor foundry yield management software

Many customers’ products run on your equipment. YieldWatchDog keeps PCM/WAT, defect, metrology, equipment and MES data in one database, monitors every imported lot and creates reports for your customers automatically.

What matters

Wafer-level process control

All fab data in one database

PCM/WAT, metrology, equipment and MES data share one data model with defect and inspection data from any vendor’s equipment — so a yield problem can be traced to the process step and tool behind it.

Equipment and process monitoring

Statistical Process Control checks every imported lot or wafer against the Shewhart, Nelson and Western Electric rules and DR YIELD’s own rules. The Equipment Monitoring Module detects tool drift and differences between similar tools, and the Tool Combination Module finds problematic combinations of tools across process stages.

Reports for your customers

The Reporting Server creates HTML and PDF reports automatically — per imported lot, on a schedule or when an SPC rule is violated — for engineering, management or your customers.

How data integration works →

Why YieldWatchDog

From excursion to root cause

In a foundry, many products share the same tools, so an excursion has to be traced quickly to the process step, tool or chamber behind it. YieldWatchDog links defect, equipment and PCM/WAT data in one environment, and the Multivariate Monitoring Module watches correlated parameters together — catching problems that stay inside every single parameter’s control limits.

Typical edition

The edition that usually fits

YieldWatchDog Industrial

Industrial is the typical edition for foundries: 16 CPU cores, unlimited concurrent clients and 120 annual support hours, for many users and high customization requirements.

Editions are sized by scale, not by company type. We’ll help you choose.

Compare the editions →

Modules

Modules worth a closer look

Every module is independently licensable and can be added to any edition.

Defect Module wafer map with defect positions, filters for defect layers and adders, a gallery of defect images and the details of a selected die

Defect Module

Defect Module

Correlate defect and inspection data from any vendor’s equipment with yield, tool and process data.

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Equipment Report in YieldWatchDog: every tool, grouped by process stage, as a tile with its impact on a parameter, colored from green (low) to red (high)

EMM

Equipment Monitoring Module

Per-equipment statistical process control, drift detection and tool commonality reporting.

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Tool Combinations view: a grid of process stages and equipment, with arrows tracing the tool combinations most common among low-yield lots

TCM

Tool Combination Module

An extension of the Equipment Monitoring Module: identify optimal and problematic tool combinations.

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SPC trend chart of a parameter by lot with control limits, out-of-control lots marked in red, in front of the notification email YieldWatchDog sent

SPC

Statistical Process Control

Automatic control limits, Shewhart and new, specially developed monitoring rules, with notifications.

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YieldWatchDog multivariate monitoring T-squared statistic view

MMM

Multivariate Monitoring Module

T² and dimension-reduction monitoring that catches problems invisible to single-parameter limits.

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Report template with a histogram and a trend chart of a parameter, built from saved views in YieldWatchDog

RSM

Reporting Server Module

Automatic HTML and PDF reports, triggered per lot, on a schedule, by an SPC violation or manually.

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Support

Direct support from our experts

A direct technical contact who understands the software and the industry — no ticketing queue, the same level of support regardless of company size.

See it working on your own data

Low-cost trial installations are available. Our team will write the loaders and parsers for your data during the installation.

Schedule Demo

Your yield data tells a deeper story. Uncover it today.

Schedule Demo