Defect Module
Defect Module
Correlate defect and inspection data from any vendor’s equipment with yield, tool and process data.
Learn more →Integrated device manufacturers
Yield management software for integrated device manufacturers
Wafer fab and test under one roof — and all their data in one consistent data model: probe, final test, PCM/WAT, defect, equipment and MES.
What matters
From wafer fab to final test
One data model for the whole flow
Because every stage shares one data model, engineers correlate across the whole flow — for example PCM/WAT results with wafer sort and final test yield — without exporting data to separate tools.
Root causes across the fab
The Defect Module links defects from any vendor’s inspection equipment to tools, process steps and lots. The Equipment Monitoring Module detects tool drift, and the Multivariate Monitoring Module catches problems that single-parameter limits miss.
Quality for zero-defect markets
Part Average Testing screens parts that pass the test limits but behave suspiciously, Spatial Signature Control finds recurring wafer patterns, and Material Tracing follows lots, wafers and dies through the supply chain.
Why YieldWatchDog
One platform for every stage
An integrated device manufacturer produces data at every stage, from the first process step to final test, and a yield problem often shows up far from its cause. With all data in one database, engineers follow a final test failure back to the wafer, lot and tools it passed through.
"Since we started using YieldWatchDog we have gained an enormous amount of value from our production test data."
Typical edition
The edition that usually fits
YieldWatchDog Industrial
Industrial is the typical edition for integrated device manufacturers: 16 CPU cores, unlimited concurrent clients and 120 annual support hours, for many users and high customization requirements. With several sites, the Ultimate edition connects the data of all locations in one analysis.
Editions are sized by scale, not by company type. We’ll help you choose.
Compare the editions →Modules
Modules worth a closer look
Every module is independently licensable and can be added to any edition.
EMM
Equipment Monitoring Module
Per-equipment statistical process control, drift detection and tool commonality reporting.
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MMM
Multivariate Monitoring Module
T² and dimension-reduction monitoring that catches problems invisible to single-parameter limits.
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SSC
Spatial Signature Control
Detect, mark and search recurring spatial wafer patterns, with email alerts when a pattern matches.
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PAT
Advanced Quality Module / PAT
Part Average Testing and neighborhood rules for automotive and other zero-defect industries.
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MTM
Material Tracing Module
Trace lot, wafer and die genealogy along the supply chain, from raw input to the final test.
Learn more →Support
Direct support from our experts
A direct technical contact who understands the software and the industry — no ticketing queue, the same level of support regardless of company size.
See it working on your own data
Low-cost trial installations are available. Our team will write the loaders and parsers for your data during the installation.
Schedule Demo