Leveraging ML to easily identify and classify wafer spatial patterns in semiconductor manufacturing. … Read More
automotive
Using Predictive Data Analytics in Manufacturing
Predictive analysis capabilities provide deep insights for production optimization and can predict failures based on anomalies in the data. … Read More
Multivariate Analysis for Full Process Visibility
Multivariate analysis, also known as multivariate monitoring, enables the detection of issues that are invisible when viewing individual parameters. … Read More
Preventing process excursion with AI & yield management software (YMS)
Early detection and analysis of process excursions decreases wafer scraps, prevents yield loss and saves engineering and manufacturing resources. … Read More
What is achievable with a Yield Management System?
Cutting-edge Yield Management Systems integrate Big Data, Smart Data, Machine Learning and AI analytics to enable semiconductor manufacturers to gain deep insight fast and save costs. … Read More
Advanced Quality Module incl. Part Average Testing (PAT)
Automotive and other quality-critical microchip suppliers have specified and rigorous requirements in order to achieve zero defects and enhance quality control and reliability. Part Average Testing (PAT) is one of the fundamental features of the Advanced Quality Module. … Read More
Integrating siloed data in semiconductor manufacturing
By using patented algorithms, the collected data is aggregated and stored in one standardized data warehouse. Once the manufacturing data is combined, it can be analyzed with a yield analytics software which also alerts yield and test engineers of any irregularities occurring in the data. … Read More
Requirements, or “Where is the pie [chart]?”
Requirements engineering is defining, analyzing and managing customers’ software requirements, resulting in software working successfully for years to come. In the semiconductor industry, the customers’ needs vary greatly, so configuring their solution is always part of the process. … Read More
Semiconductor Data Monitoring
Data monitoring in the semiconductor industry is the collection and analysis of all chip manufacturing data, including test data, wafer defect inspection data, probe tests, WAT, final inspection tests and manufacturing data from the hundreds of processes that each chip undergoes. … Read More
Inova Semiconductors Implements YieldWatchDog as Yield Management Solution
DR YIELD software & solutions GmbH, provider of the smart data analytics solution YieldWatchDog, announces that they were selected by Inova Semiconductors GmbH to enable actionable insights into their chip test data. … Read More
