Author Archives: DR_YIELD

People discussing multivariate statistics reports

How Multivariate Statistics Helps You To Get Better Yield

Electrical test data (e.g. wafer sort data) often consists of dozens of correlated parameters and therefore it is no surprise that the application of multivariate statistics monitoring can significantly improve the effectiveness of the yield control concept. … Read More

Engineer using YieldWatchDogs Event Control Feature in Factory

How to analyze factory events to prevent production failures

DR YIELD’s Event Control Feature brings fast and efficient coherence analysis of events and production failures. … Read More